APV Laboratory Tests

A powerful, yet flexible APV readout system and the related DAQ and analysis software were developed at the HEPHY, and numerous chips of APV6, APV25S0 and APV25S1 versions were tested. For the APV25S1 with no input load, equivalent noise charges of $267$ and $425\,{\rm e}$ have been found in peak and deconvolution modes, respectively, agreeing with measurements by the chip developers. Moreover, an APVMUX switching time of less than $3\,\rm ns$ has been obtained together with negligible noise contribution.